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Diffstat (limited to '1847/CH2/EX2.40/Ch02Ex40.sce')
| -rwxr-xr-x | 1847/CH2/EX2.40/Ch02Ex40.sce | 14 |
1 files changed, 14 insertions, 0 deletions
diff --git a/1847/CH2/EX2.40/Ch02Ex40.sce b/1847/CH2/EX2.40/Ch02Ex40.sce new file mode 100755 index 000000000..cb48be48d --- /dev/null +++ b/1847/CH2/EX2.40/Ch02Ex40.sce @@ -0,0 +1,14 @@ +// Scilab Code Ex2.40:: Page-2.30 (2009) +clc; clear; +mu = 1.45; // Refractive index of the film +lambda = 5500e-010; // First wavelength of visible range, cm +r = 0; // Angle of refraction for normal incidence, degrees +n = 0; // Order of interference is zero for minimum thickness +// For bright fringe in reflected pattern, +// 2*mu*t*cosd(r) = (2*n+1)*lambda/2, solving for t +t = (2*n+1)*lambda/(4*mu*cosd(r)); // Minimum thickness of the film for which light is strongly reflected + +printf("\nThe minimum thickness of the film for which light is strongly reflected = %4.2e cm", t); + +// Result +// The minimum thickness of the film for which light is strongly reflected = 9.48e-08 cm |