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+
+-- Copyright (C) 2001-2002 The University of Cincinnati.  
+-- All rights reserved. 
+
+-- This file is part of VESTs (Vhdl tESTs).
+
+-- UC MAKES NO REPRESENTATIONS OR WARRANTIES ABOUT THE SUITABILITY OF THE
+-- SOFTWARE, EITHER EXPRESS OR IMPLIED, INCLUDING BUT NOT LIMITED TO THE
+-- IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE,
+-- OR NON-INFRINGEMENT.  UC SHALL NOT BE LIABLE FOR ANY DAMAGES SUFFERED BY
+-- LICENSEE AS A RESULT OF USING, RESULT OF USING, MODIFYING OR
+-- DISTRIBUTING THIS SOFTWARE OR ITS DERIVATIVES.
+
+-- By using or copying this Software, Licensee agrees to abide by the
+-- intellectual property laws, and all other applicable laws of the U.S.,
+-- and the terms of this license.
+
+-- You may modify, distribute, and use the software contained in this
+-- package under the terms of the "GNU GENERAL PUBLIC LICENSE" version 2,
+-- June 1991. A copy of this license agreement can be found in the file
+-- "COPYING", distributed with this archive.
+
+-- You should have received a copy of the GNU General Public License
+-- along with VESTs; if not, write to the Free Software Foundation,
+-- Inc., 59 Temple Place, Suite 330, Boston, MA  02111-1307  USA 
+
+-- ---------------------------------------------------------------------
+--
+-- $Id: test114.ams,v 1.1 2002-03-27 22:11:18 paw Exp $
+-- $Revision: 1.1 $
+--
+-- ---------------------------------------------------------------------
+
+----------------------------------------------------------------------
+-- SIERRA REGRESSION TESTING MODEL
+-- Develooped at:
+-- Distriburted Processing Laboratory
+-- University of cincinnati
+-- Cincinnati
+----------------------------------------------------------------------
+-- File          : model.ams
+-- Author(s)     : Geeta Balarkishnan(gbalakri@ececs.uc.edu)
+-- Created       : May 2001
+----------------------------------------------------------------------
+-- Description :
+----------------------------------------------------------------------
+-- the test checks the correctness of the two currents associated 
+-- as through between same terminals.for eg: consider 2 resistors in
+-- parallel.. here vd is same and id and ic are the currents.
+-- the test checks for the simpel diode implementation
+-- wherein the charge is evaluated wrt a relative tolerance value
+----------------------------------------------------------------
+
+PACKAGE electricalSystem IS
+    NATURE electrical IS real ACROSS real THROUGH ground reference;
+    FUNCTION SIN(X : real) RETURN real;
+    FUNCTION EXP(X : real) RETURN real;
+    FUNCTION SQRT(X : real) RETURN real;
+    FUNCTION POW(X,Y : real) RETURN real;
+END PACKAGE electricalSystem;
+
+use work.electricalSystem.all;
+entity test is
+  generic(a:real:=1.0e-10; b:real:=0.0);
+  port (terminal t1: electrical);
+end entity;
+
+architecture atest of test is
+  quantity vd across id, ic through t1;
+  quantity charge: real;
+  --quantity ic : real;
+  constant rd: real:=1.0; 
+begin
+  e1:     id== ((vd-id*rd)/0.5);
+  e2:     charge== b*id;
+  e3:     ic==charge'dot;
+end architecture;