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diff --git a/1475/CH9/EX9.1/Example_9_1.sce b/1475/CH9/EX9.1/Example_9_1.sce
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+// Example 9.1 In order to construct a control a contol Chart
+clc;
+clear;
+n=10;
+R=0.20;
+X=8.25;
+A2=0.308;
+UCL=X+(A2*R);
+LCL=X-(A2*R);
+disp(LCL,"Lower Control Limit =",UCL,"Upper Control Limit",A2,"Constant of conversion =",n," Sample Size =");
diff --git a/1475/CH9/EX9.1/Output_9_1.PNG b/1475/CH9/EX9.1/Output_9_1.PNG
new file mode 100755
index 000000000..ba26c0bb5
--- /dev/null
+++ b/1475/CH9/EX9.1/Output_9_1.PNG
diff --git a/1475/CH9/EX9.3/Example_9_3.sce b/1475/CH9/EX9.3/Example_9_3.sce
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index 000000000..53120dff1
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+++ b/1475/CH9/EX9.3/Example_9_3.sce
@@ -0,0 +1,34 @@
+// Example 9.3 The table below shows the thickness of mica discs produced in a machine
+clc;
+clear;
+S1=[13 8 12 15 8];
+S2=[14 12 18 19 10];
+S3=[11 10 8 16 9];
+S4=[14 10 12 9 13];
+S5=[12 10 12 13 7];
+S6=[10 12 8 10 8];
+S7=[10 16 8 8 10];
+S8=[8 12 10 8 10];
+S9=[13 8 11 14 7];
+S10=[5 8 9 5 10];
+S=[S1 ; S2 ; S3 ;S4 ; S5; S6; S7; S8; S9; S10];
+Total=0;
+n=10;
+for i=1:n
+    Total=sum(S(i))+Total;
+end
+Mean=0;
+for i=1:n
+    Mean=sum(S(i))/5+Total;
+end
+X=Mean/n;
+R=6.3;
+A2=0.577;
+D4=2.115;
+D3=0;
+UCL=X+(A2*R);
+LCL=X-(A2*R);
+UCLR=D4*R;
+LCLR=D3*R;
+disp(LCLR,"Lower Control Limit for Range",UCLR,"Upper Control Limit for Range",LCL,"Lower Control Limit for Mean =",UCL,"Upper Control Limit for Mean",A2,"Constant of conversion =",n," Sample Size =");
+
diff --git a/1475/CH9/EX9.3/Output_9_3.PNG b/1475/CH9/EX9.3/Output_9_3.PNG
new file mode 100755
index 000000000..22305f0ab
--- /dev/null
+++ b/1475/CH9/EX9.3/Output_9_3.PNG
diff --git a/1475/CH9/EX9.4/Example_9_4.sce b/1475/CH9/EX9.4/Example_9_4.sce
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index 000000000..bc3c2f34f
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+++ b/1475/CH9/EX9.4/Example_9_4.sce
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+//Example 9.4 Based on 15 subgroups each of size 200 taken at intervals
+clc;
+clear;
+n=200;
+p=0.068;
+CL=p;
+UCL=p+3*(sqrt((p*(1-p)/n)));
+LCL=p-3*(sqrt((p*(1-p)/n)));
+disp(LCL,"Lower Control Limit =",UCL,"Upper Control Limit",CL,"Centre Line = ",p,"Average fraction defective =",n," Sample Size =");
diff --git a/1475/CH9/EX9.4/Output_9_4.PNG b/1475/CH9/EX9.4/Output_9_4.PNG
new file mode 100755
index 000000000..8d6845dab
--- /dev/null
+++ b/1475/CH9/EX9.4/Output_9_4.PNG
diff --git a/1475/CH9/EX9.5/Example_9_5.sce b/1475/CH9/EX9.5/Example_9_5.sce
new file mode 100755
index 000000000..b55743d7d
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+++ b/1475/CH9/EX9.5/Example_9_5.sce
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+// Example 9.5
+clc;
+clear;
+k=18;
+n=10;
+X=595.8;
+S=8.28;
+A1=1.03;
+B3=0.28;
+B4=1.72;
+CLM=X/k;
+CLSD=S/k;
+UCLM=CLM+(A1*CLSD);
+LCLM=CLM-(A1*CLSD);
+UCLS=B3*CLSD;
+LCLS=B4*CLSD;
+disp(LCLS,"Lower Control Limit for Standard Deviation",UCLS,"Upper Control Limit for Standard Deviation",LCLM,"Lower Control Limit for Mean =",UCLM,"Upper Control Limit for Mean",A1,"Constant of conversion =",n," Sample Size =",k,"No. of samples ");
diff --git a/1475/CH9/EX9.5/Output_9_5.PNG b/1475/CH9/EX9.5/Output_9_5.PNG
new file mode 100755
index 000000000..b03cd6188
--- /dev/null
+++ b/1475/CH9/EX9.5/Output_9_5.PNG
diff --git a/1475/CH9/EX9.6/Example_9_6.sce b/1475/CH9/EX9.6/Example_9_6.sce
new file mode 100755
index 000000000..8886d38ee
--- /dev/null
+++ b/1475/CH9/EX9.6/Example_9_6.sce
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+// Example 9.6 Measurements on average x and range 
+clc;
+clear;
+S_D=3.017;
+x=99.6;
+R=7.0;
+n=5;
+SE=S_D/sqrt(n);
+UCL=x+3*(S_D/sqrt(n));
+LCL=x-3*(S_D/sqrt(n));
+disp(LCL,"Lower Control Limit =",UCL,"Upper Control Limit",SE,"Standard Error = ",x,"Mean Average =",R,"Mean Range =",n," Sample Size =");
diff --git a/1475/CH9/EX9.6/Output_9_6.PNG b/1475/CH9/EX9.6/Output_9_6.PNG
new file mode 100755
index 000000000..bf5796205
--- /dev/null
+++ b/1475/CH9/EX9.6/Output_9_6.PNG
diff --git a/1475/CH9/EX9.7/Example_9_7.sce b/1475/CH9/EX9.7/Example_9_7.sce
new file mode 100755
index 000000000..5061c548d
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+++ b/1475/CH9/EX9.7/Example_9_7.sce
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+//Example 9.7 The following figures give the number of defectives in 20 sample
+clc;
+clear;
+Total=40000;
+Def=sum([425 430 216 341 225 322 280 306 337 305 356 402 216 264 126 409 193 326 280 390]);
+p=Def/Total;
+CL=p;
+n=2000;
+UCL=p+3*(sqrt((p*(1-p)/n)));
+LCL=p-3*(sqrt((p*(1-p)/n)));
+disp(LCL,"Lower Control Limit =",UCL,"Upper Control Limit",CL,"Centre Line = ",p,"Average fraction defective =",n,"Sample Items to be checked =",Total," Total No. of Samples =",Def,"Total defective identified =");
diff --git a/1475/CH9/EX9.7/Output_9_7.PNG b/1475/CH9/EX9.7/Output_9_7.PNG
new file mode 100755
index 000000000..d951de8af
--- /dev/null
+++ b/1475/CH9/EX9.7/Output_9_7.PNG
diff --git a/1475/CH9/EX9.9/Example_9_9.sce b/1475/CH9/EX9.9/Example_9_9.sce
new file mode 100755
index 000000000..3f8c6e864
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+++ b/1475/CH9/EX9.9/Example_9_9.sce
@@ -0,0 +1,10 @@
+// Examcle 9.9 The following are the numbers of defects noted in 20 hundred 
+clc;
+clear;
+Total=20;
+Def=sum([3 3 6 3 0 1 3 5 7 8 4 10 5 5 4 3 4 5 4 1]);
+c=Def/Total;
+CL=c;
+UCL=c+3*(sqrt(c));
+LCL=c-3*(sqrt(c));
+disp(LCL,"Lower Control Limit =",UCL,"Upper Control Limit",CL,"Centre Line = ",Total," Total No. of Samples =",Def,"Total defective items =");
diff --git a/1475/CH9/EX9.9/Output_9_9.PNG b/1475/CH9/EX9.9/Output_9_9.PNG
new file mode 100755
index 000000000..0227224f4
--- /dev/null
+++ b/1475/CH9/EX9.9/Output_9_9.PNG