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authorKevin2014-11-15 10:00:36 +0800
committerKevin2014-11-15 10:00:36 +0800
commit9d40ac5867b9aefe0722bc1f110b965ff294d30d (patch)
treede942df665fac4bac0d9cb7ae86910fe937b0c1a /ANDROID_3.4.5/include/linux/usb/hcd.h
parent392e8802486cb573b916e746010e141a75f507e6 (diff)
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add via modify part source code for wm8880 4.4 kitkat
Diffstat (limited to 'ANDROID_3.4.5/include/linux/usb/hcd.h')
-rw-r--r--ANDROID_3.4.5/include/linux/usb/hcd.h21
1 files changed, 21 insertions, 0 deletions
diff --git a/ANDROID_3.4.5/include/linux/usb/hcd.h b/ANDROID_3.4.5/include/linux/usb/hcd.h
index 5de41570..030f3610 100644
--- a/ANDROID_3.4.5/include/linux/usb/hcd.h
+++ b/ANDROID_3.4.5/include/linux/usb/hcd.h
@@ -476,6 +476,27 @@ struct usb_tt_clear {
extern int usb_hub_clear_tt_buffer(struct urb *urb);
extern void usb_ep0_reinit(struct usb_device *);
+/*{CharlesTu, 2010.08.26, for test mode */
+#define USB_PORT_FEAT_INDICATOR 22
+
+/*
+ * Hub Port Test Mode Selector Codes
+ * See USB 2.0 spec Table 11-24
+ */
+#define USB_PORT_TEST_J 0x01
+#define USB_PORT_TEST_K 0x02
+#define USB_PORT_TEST_SE0_NAK 0x03
+#define USB_PORT_TEST_PACKET 0x04
+#define USB_PORT_TEST_FORCE_ENABLE 0x05
+
+/*
+ * This is used for the Hi-Speed Host Electrical Tests
+ * on the root hub. See USB 2.0 spec 7.1.20 and the
+ * Embedded High-speed Host Electrical Test Procedure.
+ */
+#define USB_PORT_TEST_SINGLE_STEP_SET_FEATURE 0x00
+/*CharelsTu} */
+
/* (shifted) direction/type/recipient from the USB 2.0 spec, table 9.2 */
#define DeviceRequest \
((USB_DIR_IN|USB_TYPE_STANDARD|USB_RECIP_DEVICE)<<8)