-- Copyright (C) 2001-2002 The University of Cincinnati. -- All rights reserved. -- This file is part of VESTs (Vhdl tESTs). -- UC MAKES NO REPRESENTATIONS OR WARRANTIES ABOUT THE SUITABILITY OF THE -- SOFTWARE, EITHER EXPRESS OR IMPLIED, INCLUDING BUT NOT LIMITED TO THE -- IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, -- OR NON-INFRINGEMENT. UC SHALL NOT BE LIABLE FOR ANY DAMAGES SUFFERED BY -- LICENSEE AS A RESULT OF USING, RESULT OF USING, MODIFYING OR -- DISTRIBUTING THIS SOFTWARE OR ITS DERIVATIVES. -- By using or copying this Software, Licensee agrees to abide by the -- intellectual property laws, and all other applicable laws of the U.S., -- and the terms of this license. -- You may modify, distribute, and use the software contained in this -- package under the terms of the "GNU GENERAL PUBLIC LICENSE" version 2, -- June 1991. A copy of this license agreement can be found in the file -- "COPYING", distributed with this archive. -- You should have received a copy of the GNU General Public License -- along with VESTs; if not, write to the Free Software Foundation, -- Inc., 59 Temple Place, Suite 330, Boston, MA 02111-1307 USA -- --------------------------------------------------------------------- -- -- $Id: test114.ams,v 1.1 2002-03-27 22:11:19 paw Exp $ -- $Revision: 1.1 $ -- -- --------------------------------------------------------------------- ---------------------------------------------------------------------- -- SIERRA REGRESSION TESTING MODEL -- Develooped at: -- Distriburted Processing Laboratory -- University of cincinnati -- Cincinnati ---------------------------------------------------------------------- -- File : model.ams -- Author(s) : Geeta Balarkishnan(gbalakri@ececs.uc.edu) -- Created : May 2001 ---------------------------------------------------------------------- -- Description : ---------------------------------------------------------------------- -- the test checks the correctness of the two currents associated -- as through between same terminals.for eg: consider 2 resistors in -- parallel.. here vd is same and id and ic are the currents. -- the test checks for the simpel diode implementation -- wherein the charge is evaluated wrt a relative tolerance value ---------------------------------------------------------------- PACKAGE electricalSystem IS NATURE electrical IS real ACROSS real THROUGH ground reference; FUNCTION SIN(X : real) RETURN real; FUNCTION EXP(X : real) RETURN real; FUNCTION SQRT(X : real) RETURN real; FUNCTION POW(X,Y : real) RETURN real; END PACKAGE electricalSystem; use work.electricalSystem.all; entity test is generic(a:real:=1.0e-10; b:real:=0.0); end entity; architecture atest of test is terminal t1:electrical; quantity vd across id, ic through t1; quantity charge: real; --quantity ic : real; constant rd: real:=1.0; begin e1: id== ((vd-id*rd)/0.5); e2: charge== b*id; e3: ic==charge'dot; end architecture;