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-* Shot noise test with B source, diode
-* voltage on device (diode, forward)
-Vdev out 0 DC 0 PULSE(0.4 0.45 10u)
-* diode, forward direction, to be modeled with noise
-D1 mess 0 DMOD
-.model DMOD D IS=1e-14 N=1
-X1 0 mess out ishot
-* device between 1 and 2
-* new output terminals of device including noise: 1 and 3
-.subckt ishot 1 2 3
-* white noise source with rms 1V
-VNG 0 11 DC 0 TRNOISE(1 1n 0 0)
-*measure the current i(v1)
-V1 2 3 DC 0
-* calculate the shot noise
-* sqrt(2*current*q*bandwidth)
-BI 1 3 I=sqrt(2*abs(i(v1))*1.6e-19*1e7)*v(11)
-.ends ishot
-* 20000 sample points
-.tran 1n 20u
-.control
-run
-plot (-1)*i(vdev)
-meas tran vdev_rms avg i(vdev) from=0u to=9.9u
-meas tran vdev_rms avg i(vdev) from=10.1u to=20u
-.endc
-.end